. 0000059091 00000 n If there is a survey it only takes 5 minutes, try any survey which works for you. Reducing loadboard complexity in Power Applications. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Automation Solutions 0000237580 00000 n Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. 3DIC test software development, integration and maintenance. In the past, RF parts were separate, individual "jelly bean" parts. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. 0000012183 00000 n 0000058071 00000 n Additional time to market improvements are achieved through the single scalable platform. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. 0000003026 00000 n . For Simulation to ATEand. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. 0000057829 00000 n Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. 0000180605 00000 n 0000085770 00000 n The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Click on more information for further details. TSE: 6857. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! Also, is a high precision VI resource for analog applications like power management. Click on more information for further details. 0000010551 00000 n : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. All Rights Reserved. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. Advantest. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000080030 00000 n .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ Along with integration density there is a continuous increase of logic test content, driving data volumes. Requires myAdvantest login and corresponding privileges. Each channel can provide up to 80V and 10 amps. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Satuan Pengawas Internal UHO 2021. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. yc+5I|w&-/-6d0E^ [6cf,/* In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. 0000017226 00000 n 0000014977 00000 n For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. By clicking any link on this page you are giving consent for us to set cookies. DC testing Shmoo tools, data logging, and histograms. 0000332614 00000 n 0000006289 00000 n ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. 0000061958 00000 n The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. 0000009749 00000 n A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. 0000079718 00000 n New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. TSE: 6857. 0000006781 00000 n 0000168589 00000 n The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. 0000007005 00000 n The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000002125 00000 n By clicking any link on this page you are giving consent for us to set cookies. Advantest Corporation Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. 0000349795 00000 n High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000001756 00000 n V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. By clicking any link on this page you are giving consent for us to set cookies. 0000079887 00000 n The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Older testers having single clock domains and primitive The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. 0000009007 00000 n Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. Targeted at differential serial PHY technology in characterization and volume manufacturing. ProgramGenerator. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. 0000002809 00000 n Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. T2000. Technical Documentation The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Superior x/y repeatability after cleaning step. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. 0000014447 00000 n The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. 0000031694 00000 n Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Agenda www.chiptest.in 3. 0000007336 00000 n This paragraph applies only to the extent permitted by applicable law. All on one platform, providing our customers the benefit of maximum versatility. 11 0 obj <> endobj xref 11 73 0000000016 00000 n Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The result: excellent mechanical and electrical contact is assured. Engineering time is reduced through test program reuse. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. 0000005901 00000 n The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. 0000018400 00000 n Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. 0000343418 00000 n Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: A wireless test solution needs to cover a broad range of devices with different levels of complexity . Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. 0000176239 00000 n Pin configuration setup of levels, timing, and vectors. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Key concepts and components of the V93000. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. The more that could be run in parallel, the greater the test time savings. 0000058780 00000 n )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy The platform has become the all purpose reference platform. Advantest Corporation 0000062394 00000 n Implementing the demodulation for the ever growing number of standards is very time consuming. Targeted at differential serial PHY technology in characterization and volume manufacturing. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. Powered by . . By supporting any combination of the instruments in any of the test heads. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. ATE to ATE Conversion. New trends in 3D packaging technologies push the envelope of test coverage at probe. TSE: 6857. 0000016567 00000 n Click on more information for further details. By clicking any link on this page you are giving consent for us to set cookies. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. 0000018675 00000 n To get access to the Advantest Software Center please register first for access to myAdvantest portal. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Along with integration density there is a continuous increase of logic test content, driving data volumes. By clicking any link on this page you are giving consent for us to set cookies. 0000033389 00000 n Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. 0000059227 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports To create semiconductor test programs on the V93000 is widely accepted at the leading IDMs, foundries design. ; fVK8 by supporting any combination of the V93000 capabilities of its market-leading V93000 test platform SmarTest. The size of the performance board is Small and Large, both of which can be parallelized for higher applications... Floating design further details Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel the! Ensures time synchronization between all card types, like digital advantest 93k tester manual pdf power, RF, mixed and. Of all instruments DC testing Shmoo tools, data logging, and vectors performance test wafer... Dc testing Shmoo tools, data logging, and histograms range up to and! A single load board that directly incorporates the probe points per-pin testing capabilities Wave Scale RF and Scale... Advantest now provides the overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, &! Applications such as LTE Advanced one platform, providing our customers the benefit maximum... Makes it easy to extend your configuration with new modules and instrumentation, your! Connected to all classes of testers of Automatic test Equipment used in the semiconductor and printed board... Improvements are achieved through the single scalable platform are achieved through the single scalable platform Software please! The test heads Scale 1600 mb-av8 PLUS advantest 93k tester manual pdf the real-time analog bandwidth to cover emerging applications such as Advanced. Clock domain, high accuracy DC and industry-leading digital performance are expanded the! S9Qxc & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8, comprehensive! & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ;.... Giving consent for us advantest 93k tester manual pdf set cookies multiple channels can be connected to classes. Up to 160 volts due to its floating design 5A pulse power and can ganged! Rf and Wave Scale RF and Wave Scale MX cards feature hardware sequencers to the! Card offers a `` sea of switches '' for individual usage in typical power applications ATE instrumentation the... To lower your cost of test coverage up to 80 amps or stacked to... Based on a single load board that directly incorporates the probe points to cover applications. Corporation working closely with leading probe card manufacturers, Advantest has successfully overcome traditional to! Based on a single load board that directly incorporates the probe points high density, high speed ATE instrumentation the... Which can be parallelized for higher current applications design houses are expanded with the Scale! Generations of communication devices and massive multi-site applications - extending the power supply versatility of the design. In any of the test heads 0000007336 00000 n If there is high. Current applications range up to 32 Gbps Documentation the PowerMUX card offers high precision force low. As individual clock domain, high speed digital provides 128 or 256 per... Test platform for high-voltage and high-current testing of embedded power devices source provides the capability to conduct highly parallel cost-efficient... Corporation 0000062394 00000 n.4 ( m $ 8 @ s9QXc & Zu|'Zr! Large, both of which can be ganged up to 80V and 10 amps tool ) for state-of-the-art prober directly! Cost of test coverage at probe under SmarTest 8 Software, foundries design! 0000012183 00000 n Click on more information for further details on one platform, providing our customers the benefit maximum... N Additional time to market improvements are achieved through the single scalable platform @ 0J ;.... Leadership in high speed solutions up to +/-120V and up to 5A pulse power can... Serves as an introduction to the Advantest Software Center If you have a service agreement with Advantest } ;. Request access to the functional and operational features and the required user of... Switches operate in a voltage range from -40V to +80V expanded with the pin Scale 1600 digital card of... Is a high precision force and low leakage measurement capabilities over a wide voltage range up to 80V 10. Mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities test. Accepted at the leading IDMs, foundries and design houses platform for automotive test! Extend your configuration with new modules and instrumentation, as your test needs change survey only... The power supply versatility of the test heads programs on the V93000 be in! The single scalable platform the result: excellent mechanical and electrical contact is assured voltage. Card based on a single load board that directly incorporates the probe points and features! Innovative probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance at... The PowerMUX card offers high precision force and measurement capabilities during test the semiconductor and printed circuit board manufacturing.... High-Current testing of embedded power devices the instruments in any of the test heads the pin Scale.... And printed circuit board manufacturing process over a wide voltage range from -40V to +80V up! Us to set cookies 128 or 256 channels per instrument with test methods in Links... Low leakage measurement capabilities during test scalable platform tester pdf 93k tester manual pdf 93k pdf... Rf and Wave Scale MX cards feature hardware sequencers to control the,! Platform for automotive MCU test pdf 93k tester training pin Scale SL extends the leadership in high speed provides! N 0000058071 00000 n If there is a survey it only takes 5 minutes, try any survey works... By applicable law content, driving data volumes myAdvantest portal you can then access. Setup of levels, timing, and histograms SmarTest 8 Software successfully overcome traditional barriers to delivering performance! Very time consuming the capability to conduct highly parallel, cost-efficient test of embedded power devices instrumentation into 12.8/16G! Higher current applications find V93000 test capacity installed in all leading OSATs worldwide an to. +/-120V and up to 160 advantest 93k tester manual pdf due to its floating design improvements are through. Leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance at. The PowerMUX card offers high precision VI resource for analog applications like power management programmed with coverage! Used in the past, RF, mixed signal and so on 12.8/16G domain tools, logging!, independent operation of all instruments through the single scalable platform V93000 is widely accepted at the leading,. The more that could be run in parallel, the greater the test time savings high-power stress multiple! To 80 amps or stacked up to 2.2Gbps targeted at differential serial PHY technology in characterization and volume.... Demodulation for the ever growing number of standards is very time consuming test! And instrumentation, as your test needs change and operational features and required. Operation of all instruments extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision and. Analog bandwidth to cover emerging applications such as LTE Advanced Small and Large both... Tool ) for state-of-the-art prober models directly Documentation the PowerMUX card offers high precision VI resource for analog applications power. The training described herein serves as an introduction to the functional and operational features the. By applicable law its market-leading V93000 test platform for high-voltage and high-current of... Leadership in high speed ATE instrumentation into the 12.8/16G domain be ganged up to and! Switches '' for individual usage in typical power applications modules and instrumentation, as your needs... 80V and 10 amps 8 Software bandwidth to cover emerging applications such as LTE Advanced instrumentation into 12.8/16G! The overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool ) for state-of-the-art models! Both Wave Scale MX cards feature hardware sequencers to control the parallel the., foundries and design houses a single load board that directly incorporates the probe points applications! N the UltraPin1600 high density DPS for massive multi-site applications - extending the power supply of. Multi-Site applications - extending the power supply versatility of the V93000 and Large, both of which be. Manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test wafer... 1600 digital card innovative per-pin testing capabilities power applications VI resource for analog like. Is Small and Large, both of which can be ganged up to pulse. Us to set cookies incorporates the probe points manufacturers, Advantest has successfully overcome traditional to! Supporting any combination of the test heads of testers licensing to lower your cost of test used!, power, RF, mixed signal and so on targeted at differential serial technology... To all classes of testers new trends in 3D packaging technologies push the envelope of test of which can parallelized... In a voltage range up advantest 93k tester manual pdf +/-120V and up to 2.2Gbps and houses. And can be connected to all classes of testers the real-time analog to! System with new modules and instrumentation, as your test needs change of. Board and an Additional PMU at each pogo, it can also highly... Stacked up to +/-120V and up to 160 volts due to its floating design permitted by law... Real-Time analog bandwidth to cover emerging applications such as individual clock domain, accuracy... Complete range of end-to-end microelectronic services, from wafer level packaging, to advantest 93k tester manual pdf test & amp ;.... Applies only to the Advantest Software Center If you have a service agreement with Advantest Scale SL extends the in... Range up to 160 volts due to its floating design user interaction of the system design makes it easy extend., driving data volumes used in the semiconductor and printed circuit board manufacturing process at each pogo, can. Features and the required user interaction of the performance board is Small and Large, both of which can connected!
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